2019 IEEE International Test Conference (ITC) edit

abstract submission deadline:2019.03.11
final submission deadline:2019.03.01
Geographical:Washington Marriott Wardman Park Hotel2660 Woodley Road NWWashington, DC, USA
Organization:Philadelphia Section
Contacts:Li-C WangDepartment of ECEUCSBSanta Barbara CA USA 93106-9560+18058866017licewan
Conference Description
International Test Conference, the cornerstone of TestWeek events, is the premier conference dedicated to the electronic test of devices, boards and systems – covering the complete cycle from design verification, test, diagnosis, failure analysis and back to process improvement. At ITC, test and design professionals can confront the challenges the industry faces, and learn how these challenges are being addressed by the combined efforts of academia, design tool and equipment designers, and test engineers
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